doc/qos: HLD for WRED profile independent ECN marking thresholds#2433
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AnantKishorSharma wants to merge 1 commit into
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doc/qos: HLD for WRED profile independent ECN marking thresholds#2433AnantKishorSharma wants to merge 1 commit into
AnantKishorSharma wants to merge 1 commit into
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Add a High-Level Design for decoupling ECN marking thresholds from the WRED drop thresholds in WRED_PROFILE. Documents the new per-color CONFIG_DB fields, the orchagent-to-SAI mapping (SAI_WRED_ATTR_ECN_*), the switch-global SAI_SWITCH_ATTR_ECN_ECT_THRESHOLD_ENABLE control, validation rules, backward compatibility, and the test plan. Signed-off-by: Anant Kishor Sharma <anant.kishor-sharma@hpe.com>
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This PR adds a High-Level Design for independent ECN marking thresholds in
WRED_PROFILE, decoupling ECN marking from the WRED drop thresholds ("mark before drop") with a distinct per-color mark probability. It reuses existing SAI WRED ECN attributes — no SAI header (API) change.The design is aligned with SAI: attribute names,
sai_uint32_ttypes/defaults, the@validonlyconditions (SAI_WRED_ATTR_ECN_MARK_MODE+SAI_SWITCH_ATTR_ECN_ECT_THRESHOLD_ENABLE), and the SAI-defined fallback to the WRED drop thresholds when the ECN fields are unset (backward compatible).Related PRs and specs: